PMAN4
SEL@KIT
Author: Takeshi Sumi
  • Research duration: 2005 - 2005
  • Total publications: 1
Publication counts by year
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  • International Conference (Journal First)
  • Domestic Conference
  • Article
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Research keywords
effectiveembeddedfaulthardwarerelatedsoftwaretesting
Publications
2005
Academic Journal

[1] Takeshi Sumi, Osamu Mizuno, Tohru Kikuno, and Masayuki Hirayama, "An Effective Testing Method for Hardware Related Fault in Embedded Software", IEICE Trans. on Information and Systems, E88-D(6),  pp. 1142-1149, June 2005.

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